Suchergebnisse

In recent decades, the microelectronics industry has experienced a wide democratization of the use of telecommunication applications. The improved process design and manufacturing have produced complex and high performance analog, mixed and radio frequency circuits for these applications. However, the test cost of these integrated circuits still represents a large part of the manufacturing cost. Indeed, very often, analog testing is not just a functional test but needs measurements for specification validations. These measurements require the use of dedicated instruments expensive resources on standard industrial test equipment.One of the essential but costly specifications to validate in RF circuitry is the phase noise level. The currently used industrial technique consists in capturing the signal from the circuit under test using an RF tester channel equipped with a high performance analog to digital converter; a Fourier transform is then applied to the digitized signal and the phase noise is measured on the resulting spectrum.The approach proposed in this thesis is to achieve the phase noise measurement using solely digital low-cost resources. The basic idea is to perform 1-bit capture of the analog signal with a standard digital channel and develop post-processing algorithms dedicated for phase noise evaluation from the zero-crossings of the signal.Two methods are presented. The first method is based on an estimate of the instantaneous signal frequency and an analysis of their dispersion induced by phase noise. This method imposes a strong constraint on the sampling frequency to be used and proved to be sensitive to noise amplitude, limiting the range of possible measures. A second method is then proposed to overcome these limitations. From the binary capture of the analog signal, a reconstruction of the instantaneous phase of the signal is carried out, then filtered and characterized by a common tool of frequency stability assessment: the Allan variance. This technique, robust to amplitude noise and jitter, ...

In recent decades, the microelectronics industry has experienced a wide democratization of the use of telecommunication applications. The improved process design and manufacturing have produced complex and high performance analog, mixed and radio frequency circuits for these applications. However, the test cost of these integrated circuits still represents a large part of the manufacturing cost. Indeed, very often, analog testing is not just a functional test but needs measurements for specification validations. These measurements require the use of dedicated instruments expensive resources on standard industrial test equipment.One of the essential but costly specifications to validate in RF circuitry is the phase noise level. The currently used industrial technique consists in capturing the signal from the circuit under test using an RF tester channel equipped with a high performance analog to digital converter; a Fourier transform is then applied to the digitized signal and the phase noise is measured on the resulting spectrum.The approach proposed in this thesis is to achieve the phase noise measurement using solely digital low-cost resources. The basic idea is to perform 1-bit capture of the analog signal with a standard digital channel and develop post-processing algorithms dedicated for phase noise evaluation from the zero-crossings of the signal.Two methods are presented. The first method is based on an estimate of the instantaneous signal frequency and an analysis of their dispersion induced by phase noise. This method imposes a strong constraint on the sampling frequency to be used and proved to be sensitive to noise amplitude, limiting the range of possible measures. A second method is then proposed to overcome these limitations. From the binary capture of the analog signal, a reconstruction of the instantaneous phase of the signal is carried out, then filtered and characterized by a common tool of frequency stability assessment: the Allan variance. This technique, robust to amplitude noise and jitter, ...

In recent decades, the microelectronics industry has experienced a wide democratization of the use of telecommunication applications. The improved process design and manufacturing have produced complex and high performance analog, mixed and radio frequency circuits for these applications. However, the test cost of these integrated circuits still represents a large part of the manufacturing cost. Indeed, very often, analog testing is not just a functional test but needs measurements for specification validations. These measurements require the use of dedicated instruments expensive resources on standard industrial test equipment.One of the essential but costly specifications to validate in RF circuitry is the phase noise level. The currently used industrial technique consists in capturing the signal from the circuit under test using an RF tester channel equipped with a high performance analog to digital converter; a Fourier transform is then applied to the digitized signal and the phase noise is measured on the resulting spectrum.The approach proposed in this thesis is to achieve the phase noise measurement using solely digital low-cost resources. The basic idea is to perform 1-bit capture of the analog signal with a standard digital channel and develop post-processing algorithms dedicated for phase noise evaluation from the zero-crossings of the signal.Two methods are presented. The first method is based on an estimate of the instantaneous signal frequency and an analysis of their dispersion induced by phase noise. This method imposes a strong constraint on the sampling frequency to be used and proved to be sensitive to noise amplitude, limiting the range of possible measures. A second method is then proposed to overcome these limitations. From the binary capture of the analog signal, a reconstruction of the instantaneous phase of the signal is carried out, then filtered and characterized by a common tool of frequency stability assessment: the Allan variance. This technique, robust to amplitude noise and jitter, ...

In recent decades, the microelectronics industry has experienced a wide democratization of the use of telecommunication applications. The improved process design and manufacturing have produced complex and high performance analog, mixed and radio frequency circuits for these applications. However, the test cost of these integrated circuits still represents a large part of the manufacturing cost. Indeed, very often, analog testing is not just a functional test but needs measurements for specification validations. These measurements require the use of dedicated instruments expensive resources on standard industrial test equipment.One of the essential but costly specifications to validate in RF circuitry is the phase noise level. The currently used industrial technique consists in capturing the signal from the circuit under test using an RF tester channel equipped with a high performance analog to digital converter; a Fourier transform is then applied to the digitized signal and the phase noise is measured on the resulting spectrum.The approach proposed in this thesis is to achieve the phase noise measurement using solely digital low-cost resources. The basic idea is to perform 1-bit capture of the analog signal with a standard digital channel and develop post-processing algorithms dedicated for phase noise evaluation from the zero-crossings of the signal.Two methods are presented. The first method is based on an estimate of the instantaneous signal frequency and an analysis of their dispersion induced by phase noise. This method imposes a strong constraint on the sampling frequency to be used and proved to be sensitive to noise amplitude, limiting the range of possible measures. A second method is then proposed to overcome these limitations. From the binary capture of the analog signal, a reconstruction of the instantaneous phase of the signal is carried out, then filtered and characterized by a common tool of frequency stability assessment: the Allan variance. This technique, robust to amplitude noise and jitter, ...

Kompetenz ist spätestens mit der Teilnahme an den PISA-Studien auch in Deutschland zu einem zentralen Konstrukt nicht nur in der empirischen Bildungsforschung, sondern auch in der Bildungspolitik geworden. Kompetenzen werden, als Teil der neu formulierten Bildungsstandards, zum angestrebten Output des Bildungssystems und mit den in den vergangenen Jahren regelmäßig durchgeführten nationalen und internationalen Vergleichsmessungen gleichzeitig zum Gradmesser für seinen Erfolg. ; At the latest with the participation in the PISA studies, competence has become a central construct not only in empirical educational research but also in educational policy in Germany. Competences, as part of the newly formulated educational standards, are becoming the desired output of the education system and, with the national and international comparative measurements regularly carried out in recent years, at the same time the yardstick for its success.

For the indirect measurement of approach-avoidance tendencies, two procedures are introduced and compared. The procedures are modifications of the standard IAT and the Recoding-Free IAT (IAT-RF) and use a motivational attribute dimension (approach, avoidance) instead of an evaluative one. Study 1 (N = 162) assesses their convergent and discriminant validity with respect to self-reported measures of motivation and evaluation, and their predictive validity with respect to actual behavior. Study 2 (N = 205) furthermore compares their validity to evaluative variants of the same test paradigms. Overall, both procedures perform similarly. In Study 2, procedures based on the IAT-RF are superior, and the motivational IAT-RF shows the highest predictive validity. Unfortunately, no evidence for incremental validity over explicit measures alone is found for any of the implicit measures. Furthermore, procedures based on the IAT-RF appear to be less reliable than procedures based on the standard IAT. A possible explanation is offered.