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In this paper, Zinc oxide were deposited on a glass substrate at room temperature (RT) and two annealing temperatures 350ºC and 500ºC using laser induced plasma technique. ZnO nanofilms of 200nm thickness have been deposited on glass substrate. X-RAY diffraction (XRD), atomic force microscopy and UV-visible spectrophotometer were used to analyze the results. XRD forms of ZnO nanostructure display hexagonal structure with three recognized peaks (100), (002), and (101) orientations at 500ºC annealing temperature. The optical properties of ZnO nanostructure were determined spectra. The energy gap was 3.1 eV at 300 oC and 3.25eV at 500ºC annealing temperature.

In this paper Zener diode was designed by mixing three mixing ratios of Ag2O(1-x)ZnO(x), where x is 0.5, 0.3, and 0.1, that are deposited on a p-type porous silicon using laser induced plasma technique at room temperature (RT). The results of the Zener diode showed a decrease in knee and Zener voltage when the mixing ratio of Ag2O(1-x)ZnO(x) structure was increased. Nanofilms of 200nm thickness were prepared from pure ZnO and Ag2O as well as Ag2O(1-x)ZnO(x) with three maxing ratios and deposited on glass slides at RT to analyze the structure and optical properties. The structures of Ag2O and Ag2O(1-x)ZnO(x) showed high absorbance in the visible region with redshift in spectra when the mixing ratio was increased, while ZnO had a high absorbance in the ultraviolet region. It is concluded that when the value of x increases the energy gap value for the Ag2O(1-x)ZnO(x) structure decreases.