Suchergebnisse

"Optical detection of alpha particle emitters in the environment by air radioluminescence is a new technology that enables sensing a radiological threat at safe distances, without putting personnel at risk or contaminating equipment. Radiolumi- nescence detection systems need to be fine-tuned to efficiently capture a substantial number of photons while minimizing the contribution from ambient ultraviolet light. The accurate simulation of radioluminescence, in conjunction with ray tracing, facili- tates the design and optimization of such detection systems. In this work, an application within the Geant4 framework has been developed to simulate radioluminescence pho- tons emitted in the vicinity of accelerated alpha particles and at the surface of alpha ra- dioactive samples. The application relies on existing scintillation physics implemented in Geant4 classes such as G4OpticalPhysics and G4Scintillation, which are used to simulate radioluminescence photons as scintillations produced during the passage of alpha particles through air. The application computes the ultraviolet image of alpha particles accelerated at energies of 5.1 MeV and 8.3 MeV, as well as an extended alpha source, M. Luchkov et al., Nucl. Instrum. Meth. Phys. Res. A 1047, 167895 (2023) [1]. The application enables optimization of experimental setups for various scenarios, such as radiological emergency management, radiological crime scene investigations, or decommissioning of nuclear facilities, thus minimizing the use of costly resources and exposure to radiation."

"Application Specific Integrated Circuits (ASICs) have been, for a long time, the best, and sometimes only, option when there was a need for high performance electronics while operating with tight constraints regarding communication bandwidth, speed and/or latency, low power consumption and other, more specialized requirements, such as radiation hardness. To make sure that all ASICs that are going to be used in electronics parts installed on experimental physics detectors are working properly, they need to be thoroughly tested and their testing results need to be stored and used for manufacturing traceability purposes. A test bench solution which allows identifying and eliminating sources of errors during the integration of ASICs in detector electronics based on machine vision and test automation procedures has been designed for this purpose and is being presented."