Suchergebnisse

Disease resistance is critical in soft red winter wheat (Triticum aestivum L.) cultivars. Leaf rust caused by Puccinia triticina Eriks and stripe rust caused by Puccinia striiformis Westend. f. sp. tritici Eriks. are destructive pathogens of wheat. Phenotypic data were collected at diverse locations for resistance to leaf rust (North Carolina, Texas, and Virginia) and stripe rust (Arkansas, North Carolina, Georgia, Texas, and Virginia) in a Pioneer '25R47' /'Jamestown' (P47/JT) population composed of 186 FDX5:9 recombinant inbred lines (RILs). The P47/JT RILs were geno-typed with a public 90K iSelect single-nucleotide polymorphism array. Analysis of the P47/ JT population identified two quantitative trait loci (QTL) for leaf rust resistance on chromosome 5B and two QTL for stripe rust resistance on chromosomes 3B and 6A. These QTL were associated with both infection type and disease severity. Phenotypic variation (%) explained by the putative leaf rust resistance QTL of Jamestown on 5B was as high as 22.1%. Variation explained by the putative stripe rust resistance QTL of Jamestown on 3B and 6A was as high as 11.1 and 14.3%, respectively. Introgression and pyramiding of these QTL with other genes conferring resistance to leaf and stripe rusts via marker-assisted selection will facilitate development of soft red winter wheat cultivars having more durable resistance. ; Virginia Small Grains Board; Virginia Agricultural Council; USDAUnited States Department of Agriculture (USDA) [58-6645-4-032] ; This study was supported with funding provided by the Virginia Small Grains Board and the Virginia Agricultural Council. This material is based on work supported by the USDA, under Agreement no. 58-6645-4-032. Any opinions, findings, conclusions, or recommendations expressed in this paper are those of the authors and do not necessarily reflect the view of the USDA. The authors would like to thank the International Wheat Genome Sequencing Consortium for providing prepublication access to the IWGSC RefSeq v1.0. ; Public domain authored by a U.S. government employee