Microfoundations of information system agility, knowledge management and firm performance
In: Journal of Knowledge Management Volume 23, Number 9
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In: Journal of Knowledge Management Volume 23, Number 9
In: International studies, Band 31, Heft 4, S. 475-477
ISSN: 0973-0702, 1939-9987
In: Strategic analysis: articles on current developments, Band 17, Heft 2, S. 175-185
ISSN: 0970-0161
World Affairs Online
In: Indian journal of public administration, Band 11, Heft 2, S. 248-250
ISSN: 2457-0222
In: Indian journal of public administration, Band 10, Heft 4, S. 662-674
ISSN: 2457-0222
In: International Journal of Managing Information Technology (IJMIT) Vol.3, No.4, November 2011
SSRN
In: Studies in family planning: a publication of the Population Council, Band 8, Heft 6, S. 163
ISSN: 1728-4465
In: Defence science journal: DSJ, Band 70, Heft 5, S. 515-519
ISSN: 0011-748X
Silicon Carbide (SiC) is a wide bandgap material with unique properties attractive for high power, high temperature applications. The presence of defects in the crystal is a major issue prior device fabrication. These defects affect the performance of the device. To delineate and identify the defects an easy and quick method is desirable. In this study defects delineation in n-type 4H-SiC has been carried out by KOH, KOH+NaOH and KOH+Na2O2 melts. Variation in etch pits size was found at various concentrations of the NaOH in KOH and for different total etching times in the KOH+Na2O2 melt. The eutectic solution etching technique is found to be more efficient to delineate defects and provides control on etching and surface roughness. The etching rates have been estimated under different experimental conditions. Detailed morphological investigations have been performed by wide field high resolution optical microscopy and scanning electron microscopy.
In: Ageing international, Band 46, Heft 2, S. 200-215
ISSN: 1936-606X
In: Journal of Multimorbidity and Comorbidity, 2020
SSRN
In: Sexuality & culture, Band 17, Heft 4, S. 540-567
ISSN: 1936-4822
In: Population: revue bimestrielle de l'Institut National d'Etudes Démographiques. French edition, Band 33, Heft 1, S. 226
ISSN: 0718-6568, 1957-7966